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Application Notes |
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Composition, morphology, and grain distribution determine key properties or reasons for failure. Although traditionally observed by light, a scanning electron microscope (SEM) delivers more data. The Phenom electron microscope exceeds the resolution of light microscopes (30nm vs. 200nm) and eliminates the expense, delay and difficulty of operating a conventional SEM.
Below you find a number of examples how the Phenom is used in the material research market.
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Phenom advantages in forensics |
Forensic Applications of Scanning Electron Microscopy, a brief overview
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Metallurgical inspection using the Phenom
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