Testimonials |
Application Notes |
|
|
|
<< Back |
Composition, morphology, and grain distribution determine key properties or reasons for failure. Although traditionally observed by light, a scanning electron microscope (SEM) delivers more data. The Phenom electron microscope exceeds the resolution of light microscopes (30nm vs. 200nm) and eliminates the expense, delay and difficulty of operating a conventional SEM.
Below you find a number of examples how the Phenom is used in the material research market.
|
Fast and efficient quality control of high performance membranes
|
Crystal characterization of Almatis Tabular Alumina
|
Nano-structured Electolyte layers for Solid Oxide Fuel Cells
|
