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Fiber Classification with the Phenom
Fibers play an important part in everyday materials and cutting edge research. The Phenom ™ has been used to investigate ...
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The Phenom - the perfect addition to your SEM lab
The ease of use, high throughput, and imaging power of the Phenom™ make it a valuable compliment to any analytical SEM ...
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Tin whisker inspection with Phenom
Recent legislation by many countries has banned the use of heavy metals such as lead, cadmium, and mercury. The biggest impact ...
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Phenom Paper Applications
The process of turning raw cellulose fibers into finished paper products requires sophisticated lab tools to evaluate paper composition, ...
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Influence of music on crystal growth
The last couple of years there is a lot of news about the influence of music on almost every possible subject: plant growth, ...
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Metallurgical inspection using the Phenom
The properties of many engineering materials are mostly governed by a combination of metal composition and the morphology ...
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Micron scale insect anatomy
The samples imaged were air-dried insects (ant, fruit fly, mosquito) and a tick ...
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Forensic Applications of Scanning Electron Microscopy, a brief overview
Erwin Vermeij,Netherlands Forensic Institute,The Hague,The Netherlands.
Optical microscopes are widely used for routine imaging tasks ...
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Phenom advantages in forensics
Phenom - closing the imaging gap between Optical and Electron Microscopy.
The Phenom is a desktop ...
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Phenom use for pharmaceutical particle inspection
The Phenom™ is This application note illustrates how the Phenom can be used as an instrument for the rapid inspection and qualitative characterization of pharmaceutical particles
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Phenom imaging by backscattered electron detection
Backscattered Electron detection is the basis of Phenom™ imaging. This type of signal provides images with compositional and topographical information. Every sample
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Desktop microscopy at 24,000x - faster than the speed of light
The rapidly accelerating pace of development in micro- and nanotechnologies has created growing demand for imaging capability ...
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Multiple image allignment
When a low magnification,high resolution overview is needed,it is possible to stitch multiple pictures to create one large overview. To stitch ...
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Off-Line feature measurement with the Phenom
The Phenom provides qualitative image data of microscale structures as well as the capability to do quantitative measurements. Images ...
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