• X-view Insert

    Cross-sectional imaging of coatings
    and multilayer samples
  • 
    					

Inserts

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X-view Insert

Cross-sectional imaging of coatings and multilayer samples becomes fast and easy with this metallurgical insert. Its smart, split clamping mechanism eliminates the need for screws and tools to clamp the sample.

Key Specifications

  • Easy clamping without the need for screws or extra tools

X-view Insert

 
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Micro-electronics Insert

The micro-electronics insert is designed to image semiconductor, micro-electronics or solar cells. Its unique clamping mechanism enables loading without adhesives or surface contact.

Key Specifications

  • No scratching or contaminating the sample
  • Instant preparation and loading

Micro-electronics Insert

 
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CUSTOMER TESTIMONIALS

The Phenom makes it possible to see the world 10 times smaller than the wavelength of visible light. Find out how customers use the Phenom systems.

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