Phenom proX all-in-one desktop SEM

Spot Analysis & Elemental Mapping 
High-resolution imaging
Fully integrated system
Dealer locator

The Phenom proX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. 
With the Phenom proX desktop SEM, sample structures can be physically examined and their elemental composition determined.  Viewing three-dimensional images of microscopic structures only solves half the problem when analyzing samples. It is often necessary to collect more than optical data to be able to identify the different elements in a specimen. This is accomplished in the Phenom proX with a fully integrated and specifically designed EDS detector. 
EDS is a technique that analyzes X-rays generated by the bombardment of the sample by an electron beam. EDS elemental analysis is fully embedded into the Phenom proX system. X-ray detector and control software are combined in one package. This Elemental Identification (EID) software package allows the user to program multiple point analysis, and identify any hidden elements within the sample. Additionally, this software can be expanded with elemental mapping functionality. The step-by-step guided process within the EID software helps the user to collect all X-ray results in an organized and structured way.

NEW
ELEMENTAL MAPPING & LINE SCAN

The mapping function is an option within the EID software package. Elemental mapping reveals the distribution of elements within the sample. Here the previously selected elements for the spot analysis can be mapped at a user-specified pixel resolution and acquisition time. The real-time mapping algorithm shows live build-up of the selected element maps while storing spectra of each pixel. This allows elements to be added or removed at any time during or after the mapping process.
Mapping can be done on the image as a whole, but there is an additional benefit included to save time by adding the Selected Area option. Line Scan allows analysis over a selected line. The key lies in the possibility to select each of the following: number of points, dwell time per point and number of passes. On top of that, the results can be easily exported and reported via an automated template.

Key Specifications

  • One system, all answers
  • Magnification range 20 – 45,000x
  • Element detection range: C – Am
  • Long-life high-brightness source (CeB6)
  • Multi-high-voltage range: 5 – 15kV
  • Electron beam current selection for tuning imaging settings or high throughput analysis
  • Optional software available: Elemental Mapping and Line Scan

 
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