Materials

Composition, morphology, and grain distribution determine key properties or reasons for failure. Although traditionally observed by light, a scanning electron microscope (SEM) delivers more data. The Phenom electron microscope exceeds the resolution of light microscopes (30nm vs. 200nm) and eliminates the expense, delay and difficulty of operating a conventional SEM.

Below you find a number of examples how the Phenom is used in the material research market.

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    Testimonials

  • Fast and efficient quality control of high performance membranes

    Norit X-FlowNorit develops and applies state-of-the-art purification technologies to help soci...

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  • Crystal characterization of Almatis Tabular Alumina

    Almatis is a global leader in the development, manufacture, and supply of premium specialty alumina products. With nearly 1000 ...

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  • Nano-structured Electrolyte Layers for Solid Oxide Fuel Cells

    Research Centre Jülich GmbH, Mark Kappertz, GermanyIncreasing pollution of the atmosphere...

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    Application Notes

  • Phenom advantages in forensics

    Phenom - closing the imaging gap between Optical and Electron Microscopy. The Phenom is a desktop ...

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  • Forensic Applications of Scanning Electron Microscopy, a brief overview

    Erwin Vermeij,Netherlands Forensic Institute,The Hague,The Netherlands.  Optical microscopes are widely used for r...

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  • Metallurgical inspection using the Phenom

    The properties of many engineering materials are mostly governed by a combination of metal composition and the morphology ... Download >>