Find your ideal SEM with the Industrial Manufacturing Product Selector
The product selector is here to assist you in choosing the most suitable Scanning Electron Microscope system for your research.
X-view Insert
X-view Insert
Cross-sectional imaging of coatings and multilayer samples becomes fast and easy with this metallurgical insert. Its smart, split clamping mechanism eliminates the need for screws and tools to clamp the sample.
Key Specifications
- Easy clamping without the need for screws or extra tools
