Buildings are getting taller, architects are designing more radical structures, and stricter regulations are governing the construction sector. More stringent demands are being placed on the development and quality of construction materials. The Phenom XL desktop scanning electron microscope speeds up this development by providing answers directly without the need to wait for a central lab to analyze the samples. The capability of the Phenom XL to load samples up to 100 x 100 mm makes it possible to examine multiple or larger polished clinkers and concrete samples. A large overview can be created at high magnification using the automated image mapping software.