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Phenom ProX

Overview

The Phenom ProX desktop scanning electron microscope (SEM) is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX , sample structures can be physically examined and their elemental composition determined. 

Viewing three-dimensional images of microscopic structures only solves half the problem when analyzing samples. It is often necessary to collect more than optical data to be able to identify the different elements in a specimen. This is accomplished in the Phenom ProX with a fully integrated and specifically designed EDS detector. 

EDS is a technique that analyzes X-rays generated by the bombardment of the sample by an electron beam. EDS elemental analysis is fully embedded into the Phenom ProX system. X-ray detector and control software are combined in one package. 

The Element Identification (EID) software package allows the user to program multiple point analysis, and identify any hidden elements within the sample. Additionally, this software can be expanded with elemental mapping functionality. The step-by-step guided process within the EID software helps the user to collect all X-ray results in an organized and structured way.

Specifications

Light optical magnification
Electron optical magnification range
Resolution
Digital zoom
Light optical navigation camera
Acceleration voltages
Vacuum modes
Detector
Sample size
Sample height
 

Phenom ProX

Phenom ProX

Light optical magnification

20 - 135x

Electron optical magnification range

80 - 130,000x

Resolution

≤ 10 nm

Digital zoom

Max 12x

Light optical navigation camera

Color

Acceleration voltages

  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4,8 kV and 15 kV imaging and analysis mode

Vacuum modes

  • Standard mode
  • Charge reduction mode

Detector

  • BSD
  • EDS

Sample size

Up to 32 mm (Ø)

Sample height

Up to 100 mm

Phenom Pure

Light optical magnification

Fixed 20x

Electron optical magnification range

70 - 30,000x

Resolution

≤ 30 nm

Digital zoom

Max. 12x

Light optical navigation camera

Black & White

Acceleration voltages

Default: 5 kV

Vacuum modes

 

Detector

 

Sample size

Up to 32 mm (Ø)

Sample height

Up to 100 mm

Phenom Pro

Light optical magnification

20 - 135x

Electron optical magnification range

80 - 130,000x

Resolution

≤ 10 nm

Digital zoom

Max. 12x

Light optical navigation camera

Color

Acceleration voltages

  • Default: 5 kV, 10 kV
  • Advanced mode: adjustable range between 4,8 kV and 10 kV imaging mode

Vacuum modes

  • Standard mode
  • Charge reduction mode

Detector

  • BSD
  • EDS (optional)

Sample size

Up to 32 mm (Ø)

Sample height

Up to 100 mm

Case Studies

Scientist at DSM Ahead

Dr. Arnaud Chiche

"The Phenom was bought initially to support the nano-fibers project, but today is used for several projects in multiple fields. This has proven to be very..."

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Managing Director Synapse

Bas de Laat

"Until recently we viewed a drop of blood under an optical microscope. It took three days to fully analyse. Now we put the sample under the SEM and are ready."

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Faculty of Textile Engineering, Technical University of Liberec

Jitka Färberová

"The purchase of the Phenom desktop scanning electron microscope has improved our workflow and research programs. Whereas in the past, we had to wait an ..."

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Technology Manager

Luuk Berkelaar

It was the resolution and magnification that were the most important features for us. In addition, using the elemental analysis we can determine ...

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Program director of textile engineering

Dr. Russell Gorga

Cust test Textile Engineering North Carolina State University Cust test Textile Engineering North Carolina State University

We have moved our Phenom SEM out of the research lab and into our undergraduate teaching laboratory – allowing us, in real time, to grab a sample and project...

Ph.D Assistant Professor Institute for Molecular Science, National Institutes of Natural Sciences Japan

Shiro Yoshioka

"The speed of Phenom ProX and user-friendly ParticleMetric software will provide great advantages for researchers investigating microorganisms."

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Section Head Analysis Technology, Kunststoff-Institut Lüdenscheid

Dr. Andreas Balster

This case study explains how the Phenom ProX allows researchers to investigate various plastic materials without extensive sample preparations.

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Process Engineer, Mosa

Berry Veltman

"Thanks to Phenom, we have been able to conduct analyses in greater detail and identify increased concentrations of carbon or iron with similar nodular defects"

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President of Graphite Machining Services & Innovations, LLC

Peter Guercio

"Our recent product release came to market 8x faster than before, thanks to the real time data acquisition and elemental analysis of the Phenom ProX with EDS."

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